| publication |
| Title | Comparing novel small-angle x-ray scattering approaches for absolute size and number concentration measurements of spherical SiO<sub>2</sub> particles to established methods |
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| Year | 2024 |
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| DOI | 10.1088/1361-6528/ad568b |
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| Authors | Zoltán Varga, Anikó Gaál |
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Comparing novel small-angle x-ray scattering approaches for absolute size and number concentration measurements of spherical SiO<sub>2</sub> particles to established methods (2024)Robin Schürmann, Anikó Gaál, Aneta Sikora, David Ojeda, Dorota Bartczak, Heidi Goenaga-Infante, Virpi Korpelainen, Bruno Sauvet, Jérôme Deumer, Zoltán Varga, Christian Gollwitzer Nanotechnology 35/38 p385701
IOP Publishing DOI:10.1088/1361-6528/ad568b